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SPIE Proceedings [SPIE 32nd Annual Technical Symposium - San Diego, CA (Monday 15 August 1988)] X-Ray Multilayers in Diffractometers, Monochromators, and Spectrometers - Evaluation Of Alternative Mo-Si Multilayer For Soft X-Ray Mirrors By Electron Microscopy And X-Ray Diffraction
Ogura, Shigetaro, Hayashida, Mas ami, Ishizaki, Akemi, Kato, Yoshiaki, Wood, James L., Christensen, Finn E.Volume:
984
Year:
1988
Language:
english
DOI:
10.1117/12.948780
File:
PDF, 13.80 MB
english, 1988