SPIE Proceedings [SPIE First European Conference on Optics Applied to Metrology - Strasbourg, France (Wednesday 26 October 1977)] 1st European Conf on Optics Applied to Metrology - Determination Of The Index Profile Of A Dielectric Plate By Optical Methods
Roger, Andre, Maystre, Daniel, Grosmann, Michel H., Meyrueis, PatrickVolume:
136
Year:
1978
Language:
english
DOI:
10.1117/12.956133
File:
PDF, 122 KB
english, 1978