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SPIE Proceedings [SPIE First European Conference on Optics Applied to Metrology - Strasbourg, France (Wednesday 26 October 1977)] 1st European Conf on Optics Applied to Metrology - Comparison Of Wavelengths To The Primary Standard At The French National Institute Of Metrology
Bouchareine, P., Janest, A., Grosmann, Michel H., Meyrueis, PatrickVolume:
136
Year:
1978
Language:
english
DOI:
10.1117/12.956136
File:
PDF, 420 KB
english, 1978