![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE 1985 International Conference on Fourier and Computerized Infrared Spectroscopy - Ottawa, Canada (Tuesday 1 January 1985)] Fourier and Computerized Infrared Spectroscopy - IR and Far IR Characterization of High Surface Materials and Adsorbed Species
Hoffman, P., Knozinger, E., Cameron, David G., Grasselli, Jeannette G.Volume:
553
Year:
1985
Language:
english
DOI:
10.1117/12.970927
File:
PDF, 167 KB
english, 1985