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[IEEE 2016 IEEE International Memory Workshop (IMW) - Paris, France (2016.5.15-2016.5.18)] 2016 IEEE 8th International Memory Workshop (IMW) - Internal Cell Resistance as the Origin of Abrupt Reset Behavior in HfO2-Based Devices Determined from Current Compliance Series
Hardtdegen, Alexander, La Torre, Camilla, Zhang, Hehe, Funck, Carsten, Menzel, Stephan, Waser, Rainer, Hoffmann-Eifert, SusanneYear:
2016
Language:
english
DOI:
10.1109/imw.2016.7495280
File:
PDF, 3.53 MB
english, 2016