SPIE Proceedings [SPIE Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics: International Workshop - Kiev, Ukraine (Thursday 6 May 1993)] Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Optical monitoring of vitreous films: structure and composition
Lisovskii, I. P., Litovchenko, Vladimir G., Lozinskii, V. B., Schmidt, E. G., Svechnikov, Sergei V., Valakh, Mikhail Y.Volume:
2113
Year:
1994
Language:
english
DOI:
10.1117/12.191970
File:
PDF, 696 KB
english, 1994