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SPIE Proceedings [SPIE Photonics Asia - Beijing, China (Monday 5 November 2012)] Optical Design and Testing V - A novel optical beam deflection detection system based on aspheric lens for high-speed atomic force microscope
Zhao, Jianyong, Shang, Guangyi, Gong, Weitao, Yao, Junen, Wang, Yongtian, Du, Chunlei, Hua, Hong, Tatsuno, Kimio, Urbach, H. PaulVolume:
8557
Year:
2012
Language:
english
DOI:
10.1117/12.2000814
File:
PDF, 578 KB
english, 2012