SPIE Proceedings [SPIE International Symposium on Optoelectronic Technology and Application 2014 - Beijing, China (Tuesday 13 May 2014)] International Symposium on Optoelectronic Technology and Application 2014: Laser and Optical Measurement Technology; and Fiber Optic Sensors - Simulate different environments TDLAS On the analysis of the test signal strength
Czarske, Jurgen, Zhang, Shulian, Sampson, David, Wang, Wei, Liao, Yanbiao, Li, Xin, Zhou, Tao, Jia, XiaodongVolume:
9297
Year:
2014
Language:
english
DOI:
10.1117/12.2073093
File:
PDF, 2.27 MB
english, 2014