SPIE Proceedings [SPIE SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 4 August 1996)] Optics for High-Brightness Synchrotron Radiation Beamlines II - Advantages of in-situ LTP distortion profile test on high heat load mirrors and applications
Qian, Shinan, Jark, Werner H., Sostero, Giovanni, Gambitta, Alessandro, Mazzolini, Fabio, Savoia, Adolfo, Berman, Lonny E., Arthur, JohnVolume:
2856
Year:
1996
Language:
english
DOI:
10.1117/12.259870
File:
PDF, 596 KB
english, 1996