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SPIE Proceedings [SPIE Optical Science, Engineering and Instrumentation '97 - San Diego, CA (Sunday 27 July 1997)] Coherent Electron-Beam X-Ray Sources: Techniques and Applications - High-resolution phase contrast microscopy with a hard x-ray waveguide
Cedola, Alessia, Cloetens, Peter, Di Fonzo, Silvia, Jark, Werner H., Lagomarsino, Stefano, Soullie, G., Riekel, Christian, Freund, Andreas K., Freund, Henry P., Howells, Malcolm R.Volume:
3154
Year:
1997
Language:
english
DOI:
10.1117/12.279388
File:
PDF, 571 KB
english, 1997