SPIE Proceedings [SPIE Photonics China '98 - Beijing, China (Wednesday 16 September 1998)] Automated Optical Inspection for Industry: Theory, Technology, and Applications II - Automation of temperature measurement by laser
Fei, Yue, Xi, Yangang, Chen, Yuanjie, Ma, Xiufang, Shen, Yuanhua, Ye, ShenghuaVolume:
3558
Year:
1998
Language:
english
DOI:
10.1117/12.318362
File:
PDF, 592 KB
english, 1998