SPIE Proceedings [SPIE Photonics East (ISAM, VVDC, IEMB) - Boston, MA (Sunday 1 November 1998)] Advanced Sensors and Monitors for Process Industries and the Environment - Group velocity delay spectroscopy technique for industrial monitoring of electron-beam-induced vapors
Benterou, Jerry J., Berzins, Leon V., Sharma, Manish N., de Groot, Wim A.Volume:
3535
Year:
1999
Language:
english
DOI:
10.1117/12.337473
File:
PDF, 1.54 MB
english, 1999