SPIE Proceedings [SPIE Symposium on Micromachining and...

  • Main
  • SPIE Proceedings [SPIE Symposium on...

SPIE Proceedings [SPIE Symposium on Micromachining and Microfabrication - Santa Clara, CA (Monday 20 September 1999)] MEMS Reliability for Critical and Space Applications - Reliability of microsystems based on a failure mechanism approach

Cruzel, S., Esteve, Daniel, Dilhan, Monique, Fourniols, Jean-Yves, Pressecq, Francis, Puig, O., Simonne, Jean-Jacques, Lawton, Russell A., Miller, William M., Lin, Gisela, Ramesham, Rajeshuni
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
3880
Year:
1999
Language:
english
DOI:
10.1117/12.359364
File:
PDF, 1.24 MB
english, 1999
Conversion to is in progress
Conversion to is failed