SPIE Proceedings [SPIE Optics and Optoelectronic Inspection...

  • Main
  • SPIE Proceedings [SPIE Optics and...

SPIE Proceedings [SPIE Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments - Beijing, China (Wednesday 8 November 2000)] Advanced Photonic Sensors: Technology and Applications - Novel method for two-coordinate slope test with fiber optic sensor

Zhao, Yong, Li, Pengsheng, Pu, Zhaobang, Sun, Zhengnai, Tang, Jinfa, Xu, Chao-Nan, Li, Haizhang
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
4220
Year:
2000
Language:
english
DOI:
10.1117/12.401714
File:
PDF, 182 KB
english, 2000
Conversion to is in progress
Conversion to is failed