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SPIE Proceedings [SPIE Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments - Beijing, China (Wednesday 8 November 2000)] Advanced Photonic Sensors: Technology and Applications - Novel method for two-coordinate slope test with fiber optic sensor
Zhao, Yong, Li, Pengsheng, Pu, Zhaobang, Sun, Zhengnai, Tang, Jinfa, Xu, Chao-Nan, Li, HaizhangVolume:
4220
Year:
2000
Language:
english
DOI:
10.1117/12.401714
File:
PDF, 182 KB
english, 2000