SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] X-Ray Optics, Instruments, and Missions IV - Grazing incidence flat-field spectrometer with spatial resolution capability for extended sources
Poletto, Luca, Tondello, Giuseppe, Hoover, Richard B., Walker II, Arthur B. C.Volume:
4138
Year:
2000
Language:
english
DOI:
10.1117/12.407558
File:
PDF, 321 KB
english, 2000