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SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Applications of Digital Image Processing XXIII - Tool for the evaluation of cigarette paper marking quality
Bloch, Jean-Francis, Falgueras, D. Bertran, Tescher, Andrew G.Volume:
4115
Year:
2000
Language:
english
DOI:
10.1117/12.411547
File:
PDF, 207 KB
english, 2000