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SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - Seattle, WA (Sunday 7 July 2002)] X-Ray Mirrors, Crystals, and Multilayers II - Characterization of amorphous carbon films as total-reflection mirrors for XUV free-electron lasers
Jacobi, Sandra, Steeg, Barbara, Wiesmann, Jorg, Stormer, Michael, Feldhaus, Josef, Bormann, Rdiger, Michaelsen, Carsten, Freund, Andreas K., Macrander, Albert T., Ishikawa, Tetsuya, Wood, James L.Volume:
4782
Year:
2002
Language:
english
DOI:
10.1117/12.450460
File:
PDF, 300 KB
english, 2002