SPIE Proceedings [SPIE Photonics Fabrication Europe - Brugge, Belgium (Monday 28 October 2002)] Transducing Materials and Devices - Simple interferometric method for measuring severally the refractive index and the thickness of transparent plates
Coppola, Giuseppe, Ferraro, Pietro, Iodice, Mario, de Nicola, Sergio, Bar-Cohen, YosephVolume:
4946
Year:
2003
Language:
english
DOI:
10.1117/12.472045
File:
PDF, 300 KB
english, 2003