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SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, CA (Sunday 3 August 2003)] Optical Manufacturing and Testing V - Regression analysis for wavefront fitting with Zernike polynomials
Qi, Bo, Chen, Hongbin, Ma, Jiaguang, Dong, Nengli, Stahl, H. PhilipVolume:
5180
Year:
2003
Language:
english
DOI:
10.1117/12.501144
File:
PDF, 833 KB
english, 2003