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SPIE Proceedings [SPIE Speckle Metrology 2003 - Trondheim, Norway (Wednesday 18 June 2003)] Speckle Metrology 2003 - Comparative analysis of digital and optical speckle displacement techniques for study of in-plane surface strains
Muravsky, Leonid I., Maksymenko, Olexander P., Sakharuk, Olexandaer M., Gastinger, Kay, Lokberg, Ole J., Winther, SveinVolume:
4933
Year:
2003
Language:
english
DOI:
10.1117/12.516625
File:
PDF, 151 KB
english, 2003