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SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] X-Ray Sources and Optics - Multilayer optics for Mo-radiation-based crystallography
Storm, Arjen B., Michaelsen, Carsten, Oehr, Alexandra, Hoffmann, Christian, MacDonald, Carolyn A., Macrander, Albert T., Ishikawa, Tetsuya, Morawe, Christian, Wood, James L.Volume:
5537
Year:
2004
Language:
english
DOI:
10.1117/12.557153
File:
PDF, 182 KB
english, 2004