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SPIE Proceedings [SPIE Photonics Asia 2004 - Beijing, China (Monday 8 November 2004)] Advanced Materials and Devices for Sensing and Imaging II - The 3D measurement system on color-encoded technique and its simulation
Yuan, Huijuan, Wang, Anbo, Zhang, Yimo, Zhou, Baoguo, Zou, Chunhong, Ishii, Yukihiro, Guo, Jianying, Yu, XiaoyangVolume:
5633
Year:
2004
Language:
english
DOI:
10.1117/12.575667
File:
PDF, 144 KB
english, 2004