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SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 13 June 2005)] Optical Measurement Systems for Industrial Inspection IV - Reflectivity function based illumination and sensor planning for industrial inspection
Ellenrieder, Marc M., Osten, Wolfgang, Gorecki, Christophe, Wohler, Christian, d'Angelo, Pablo, Novak, Erik L.Volume:
5856
Year:
2005
Language:
english
DOI:
10.1117/12.612547
File:
PDF, 571 KB
english, 2005