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SPIE Proceedings [SPIE Defense and Security Symposium - Orlando, FL (Monday 9 April 2007)] Visual Information Processing XVI - Application of particle analysis to transmission electron microscopy (TEM)

DaPonte, J., Sadowski, T., Broadbridge, C. C., Day, D., Lehman, A. H., Krishna, D., Marinella, L., Munhutu, P., Sawicki, M., Rahman, Zia-ur, Reichenbach, Stephen E., Neifeld, Mark A.
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Volume:
6575
Year:
2007
Language:
english
DOI:
10.1117/12.714749
File:
PDF, 533 KB
english, 2007
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