SPIE Proceedings [SPIE Integrated Optoelectronic Devices 2008 - San Jose, CA (Saturday 19 January 2008)] Photonics Packaging, Integration, and Interconnects VIII - Automatic tester for high power diode laser bars
Miesner, Joern, Glebov, Alexei L., Chen, Ray T., Frischkorn, Felix, Uhlig, NielsVolume:
6899
Year:
2008
Language:
english
DOI:
10.1117/12.768351
File:
PDF, 542 KB
english, 2008