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SPIE Proceedings [SPIE International Symposium on Instrumentation Science and Technology - Shenyang, China (Monday 15 September 2008)] Fifth International Symposium on Instrumentation Science and Technology - A diffraction grating scale for long range and nanometer resolution

Fan, Kuang-Chao, Tan, Jiubin, Wen, Xianfang, Li, Bai-Kun, Liu, Chi-Hui
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Volume:
7133
Year:
2008
Language:
english
DOI:
10.1117/12.815188
File:
PDF, 501 KB
english, 2008
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