SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California (Sunday 21 February 2010)] Design for Manufacturability through Design-Process Integration IV - Variability aware timing models at the standard cell level
Chin, Eric Y., Rieger, Michael L., Thiele, Joerg, Levy, Cooper S., Neureuther, Andrew R.Volume:
7641
Year:
2010
Language:
english
DOI:
10.1117/12.846689
File:
PDF, 1.67 MB
english, 2010