SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Application of the laser scanning confocal microscope in fluorescent film sensor research
Zhang, Hongyan, Zhang, Yudong, Sasián, José, Liu, Wei-Min, Zhao, Wen-Wen, Xiang, Libin, To, Sandy, Dai, Qing, Wang, Peng-FeiVolume:
7656
Year:
2010
Language:
english
DOI:
10.1117/12.865797
File:
PDF, 1.65 MB
english, 2010