![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Photonics Asia 2010 - Beijing, China (Monday 18 October 2010)] Optical Metrology and Inspection for Industrial Applications - Distance measurement for curved surface based on confocal technique
Luo, Jianbo, Harding, Kevin, Huang, Peisen S., Liang, Yiyong, Ding, Wuji, Yoshizawa, Toru, Yang, GuoguangVolume:
7855
Year:
2010
Language:
english
DOI:
10.1117/12.869825
File:
PDF, 1.02 MB
english, 2010