SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California (Saturday 22 January 2011)] Practical Holography XXV: Materials and Applications - Quantitative quality measure based on light wave distribution to access 3D display
Sakamoto, Yuji, Bjelkhagen, Hans I., Okuyama, FumioVolume:
7957
Year:
2011
Language:
english
DOI:
10.1117/12.874585
File:
PDF, 250 KB
english, 2011