SPIE Proceedings [SPIE SPIE Advanced Lithography - San...

  • Main
  • SPIE Proceedings [SPIE SPIE Advanced...

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 27 February 2011)] Optical Microlithography XXIV - Effective decomposition algorithm for self-aligned double patterning lithography

Zhang, Hongbo, Du, Yuelin, Wong, Martin D. F., Topaloglu, Rasit, Conley, Will
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
7973
Year:
2011
Language:
english
DOI:
10.1117/12.879324
File:
PDF, 376 KB
english, 2011
Conversion to is in progress
Conversion to is failed