SPIE Proceedings [SPIE International Symposium on Photoelectronic Detection and Imaging 2011 - Beijing, China (Tuesday 24 May 2011)] International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications - A study on the buffeting aberrance regulation of TDICCD mapping camera
Bai, Zhe, Ma, Zhen, Zhang, BohengVolume:
8194
Year:
2012
Language:
english
DOI:
10.1117/12.900996
File:
PDF, 443 KB
english, 2012