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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - Burlingame, California, United States (Sunday 22 January 2012)] Image Quality and System Performance IX - Selecting the proper window for SSIM
McFadden, Steven B., Gaykema, Frans, Burns, Peter D., Ward, Paul A. S.Volume:
8293
Year:
2012
Language:
english
DOI:
10.1117/12.909544
File:
PDF, 144 KB
english, 2012