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SPIE Proceedings [SPIE 1986 International Symposium/Innsbruck - Innsbruck, Austria (Tuesday 15 April 1986)] Integrated Optical Circuit Engineering III - Computer Aided Measurement Techniques for Integrated Optic Devices
Schlaak, H. F., Sulz, G., Zhan, Yuan-ling, Brandenburg, A., Kersten, Ralf T.Volume:
651
Year:
1986
Language:
english
DOI:
10.1117/12.938157
File:
PDF, 186 KB
english, 1986