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SPIE Proceedings [SPIE 1988 Robotics Conferences - Boston, MA (Monday 7 November 1988)] Optics, Illumination, and Image Sensing for Machine Vision III - Structured Highlight Inspection Of Specular Surfaces Using Extended Gaussian Images
Nayar, Shree K., Weiss, Lee E., Simon, David A., Sanderson, Arthur C., Svetkoff, Donald J.Volume:
1005
Year:
1989
Language:
english
DOI:
10.1117/12.949050
File:
PDF, 8.37 MB
english, 1989