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SPIE Proceedings [SPIE Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life - Novosibirsk, Russia (Monday 9 September 2002)] Seventh International Symposium on Laser Metrology Applied to Science,Industry, and Everyday Life - Outlooks and features of metrological assurance of dynamic parameters measurements in fiber optic communication systems in the gigabyte range
Romashkov, A. P., Tikhomirov, S. V., Chugui, Yuri V., Bagayev, Sergei N., Weckenmann, Albert, Osanna, P. HerbertVolume:
4900
Year:
2002
Language:
english
DOI:
10.1117/12.484588
File:
PDF, 163 KB
english, 2002