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SPIE Proceedings [SPIE Optics East 2005 - Boston, MA (Sunday 23 October 2005)] Wavelet Applications in Industrial Processing III - A new wavelet sub-band characterization for texture recognition
Mourougaya, François, Truchetet, Frederic, Laligant, Olivier, Carré, Philippe, Fernandez-Maloigne, ChristineVolume:
6001
Year:
2005
Language:
english
DOI:
10.1117/12.629333
File:
PDF, 682 KB
english, 2005