SPIE Proceedings [SPIE SPIE Optics + Photonics - San Diego, California, USA (Sunday 13 August 2006)] Developments in X-Ray Tomography V - 3-dimensional strain fields from tomographic measurements
Haldrup, K., Bonse, Ulrich, Nielsen, S. F., Mishnaevsky, Jr., L., Beckmann, F., Wert, J. A.Volume:
6318
Year:
2006
Language:
english
DOI:
10.1117/12.679043
File:
PDF, 1.15 MB
english, 2006