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SPIE Proceedings [SPIE 2nd European Congress on Optics Applied to Metrology - Strasbourg, France (Monday 26 November 1979)] 2nd European Congress on Optics Applied to Metrology - Laser Beam Scanning For Remote Control
Neyroud, Jean, Metayer, Philippe, Danel, Francois, Grosmann, Michel H., Meyrueis, PatrickVolume:
210
Year:
1980
Language:
english
DOI:
10.1117/12.958323
File:
PDF, 164 KB
english, 1980