TEM Study of Schottky Junctions in Reconfigurable Silicon...

Advanced Engineering Materials 2016 / 02 Vol. 18; Iss. 2

TEM Study of Schottky Junctions in Reconfigurable Silicon Nanowire Devices

Banerjee, Sayanti, Löffler, Markus, Muehle, Uwe, Berent, Katarzyna, Heinzig, André, Trommer, Jens, Weber, Walter, Zschech, Ehrenfried
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Volume:
18
Language:
english
Journal:
Advanced Engineering Materials
DOI:
10.1002/adem.201400577
Date:
February, 2016
File:
PDF, 1.55 MB
english, 2016
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