8.2.3 Optimal integration and test planning applied to...

INCOSE International Symposium 2007 / 06 Vol. 17; Iss. 1

8.2.3 Optimal integration and test planning applied to lithographic systems1

Boumen, R., de Jong, I.S.M., van de Mortel-Fronczak, J.M., Rooda, J.E.
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Volume:
17
Language:
english
Journal:
INCOSE International Symposium
DOI:
10.1002/j.2334-5837.2007.tb02950.x
Date:
June, 2007
File:
PDF, 1018 KB
english, 2007
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