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Defect-enabled electrical current leakage in ultraviolet light-emitting diodes
Moseley, Michael W., Allerman, Andrew A., Crawford, Mary H., Wierer, Jonathan J., Smith, Michael L., Biedermann, Laura B.Volume:
212
Language:
english
Journal:
physica status solidi (a)
DOI:
10.1002/pssa.201400182
Date:
April, 2015
File:
PDF, 375 KB
english, 2015