Influence of grain boundaries and interfaces on the...

Influence of grain boundaries and interfaces on the electronic structure of polycrystalline CuO thin films

Morasch, Jan, Wardenga, Hans F., Jaegermann, Wolfram, Klein, Andreas
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Volume:
213
Language:
english
Journal:
physica status solidi (a)
DOI:
10.1002/pssa.201533018
Date:
June, 2016
File:
PDF, 986 KB
english, 2016
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