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Influence of grain boundaries and interfaces on the electronic structure of polycrystalline CuO thin films
Morasch, Jan, Wardenga, Hans F., Jaegermann, Wolfram, Klein, AndreasVolume:
213
Language:
english
Journal:
physica status solidi (a)
DOI:
10.1002/pssa.201533018
Date:
June, 2016
File:
PDF, 986 KB
english, 2016