![](/img/cover-not-exists.png)
Reflectance analysis on the MOCVD growth of AlN on Si(111) by the virtual interface model
Ng, Tuoh-Bin, Ewoldt, David A., Shepherd, Debra A., Loboda, Mark J.Volume:
12
Language:
english
Journal:
physica status solidi (c)
DOI:
10.1002/pssc.201400159
Date:
April, 2015
File:
PDF, 427 KB
english, 2015