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P-55: Process Development of Integrated Vcom and PAS using Wet Etching Bias Control for High Resolution UHD AH-IPS TFT-LCD
Kwack, Heeyoung, Kim, Eungyong, Park, Chulho, Nam, Myungwoo, Yu, Sangjeon, Park, Jongwook, Shin, SangmunVolume:
46
Language:
english
Journal:
SID Symposium Digest of Technical Papers
DOI:
10.1002/sdtp.10122
Date:
June, 2015
File:
PDF, 1.56 MB
english, 2015