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Statistically rigorous analysis of imaging SIMS data in the presence of detector saturation
Gelb, Lev D., Bakhtiari, Layla A., Walker, Amy V.Volume:
47
Language:
english
Journal:
Surface and Interface Analysis
DOI:
10.1002/sia.5790
Date:
September, 2015
File:
PDF, 4.58 MB
english, 2015