Time-of-flight secondary ion mass spectrometric analysis of...

Rapid Communications in Mass Spectrometry 2008 Vol. 22; Iss. 7

Time-of-flight secondary ion mass spectrometric analysis of the interface between bone and titanium implants

Cecilia Eriksson, Per Malmberg, Håkan Nygren
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Volume:
22
Year:
2008
Language:
english
Pages:
7
DOI:
10.1002/rcm.3445
File:
PDF, 330 KB
english, 2008
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