Ion yield improvement for static secondary ion mass...

Rapid Communications in Mass Spectrometry 2008 Vol. 22; Iss. 10

Ion yield improvement for static secondary ion mass spectrometry by use of polyatomic primary ions

Roel De Mondt, Luc Van Vaeck, Andreas Heile, Heinrich F. Arlinghaus, Nicolas Nieuwjaer, Arnaud Delcorte, Patrick Bertrand, Jens Lenaerts, Frank Vangaever
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Volume:
22
Year:
2008
Language:
english
Pages:
16
DOI:
10.1002/rcm.3533
File:
PDF, 373 KB
english, 2008
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