Atomic/molecular depth profiling of nanometric-metallized...

Atomic/molecular depth profiling of nanometric-metallized polymer thin films by secondary ion mass spectrometry

Helena Téllez, José Miguel Vadillo, José Javier Laserna
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Volume:
24
Year:
2010
Language:
english
Pages:
6
DOI:
10.1002/rcm.4418
File:
PDF, 260 KB
english, 2010
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