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Accurate ultra-low-energy secondary ion mass spectrometry analysis of wide bandgap GaN/InxGa1–xN structures using optical conductivity enhancement
R. J. H. Morris, M. G. Dowsett, R. Beanland, P. J. Parbrook, C. F. McConvilleVolume:
24
Year:
2010
Language:
english
Pages:
5
DOI:
10.1002/rcm.4623
File:
PDF, 320 KB
english, 2010